Surface roughness and its structural orientation caused by internal microstructural changes in mechanically stressed copper conductors

  • In this paper, the mechanical damage behavior is investigated based on the characteristic roughness on the surface and the orientation of superficial structures. The main goal is to explore the surface roughness on mechanically loaded copper conductors as a lifetime indicator. For this purpose, copper conductors are mechanically stressed in accordance with EN 50,396 and then examined metallographically and microscopically. The microstructure examination shows that the roughness is caused by material extrusion and cracks due to work hardening in the surface area. Using confocal microscopy, it is shown for the first time that significant formation of surface roughness takes place over the service life of copper conductors. The roughness increases monotonically, but not linearly with number of cycles, due to internal microstructural processes and can be divided into three sections. First inspections of the conductor surface over lifetime show a correlation between the intensity of structures orientated 45° to the loading direction and the roughness. This phenomenon, already known from microscopic slip lines, is thus also evident in macroscopic roughness formation and is well founded by the research theory on material extrusion along dislocation lines. In summary, a lifetime determination is possible based on its developing roughness which enables the utilization as a sensor element.

Download full text files

Export metadata

Metadaten
Author:Philipp Baron, Philipp Lenz, Maria Schomer, Klaus P. Koch, Armin Wittmann, Georg Fischer
URN:urn:nbn:de:hbz:tr5-1503
DOI:https://doi.org/10.1007/s10853-022-07579-w
Parent Title (English):Journal of Materials Science
Publisher:Springer
Document Type:Article
Language:English
Date of OPUS upload:2022/09/27
Date of first Publication:2022/08/13
Publishing University:Hochschule Trier
Release Date:2022/09/27
Tag:confocal microscopy; copper conductors; material extrusion; surface roughness
GND Keyword:Rauigkeit; Elektrischer Leiter; Kupfer; Konfokale Mikroskopie
Volume:57
Issue:32
Page Number:11
First Page:15549
Last Page:15559
Departments:FB Technik
Dewey Decimal Classification:6 Technik, Medizin, angewandte Wissenschaften / 60 Technik
Licence (German):License LogoCreative Commons - CC BY - Namensnennung 4.0 International